Stampa
Modelling Transformer Short-Circuit Reliability Using Multi-Stress Accelerated Test Data
Published in:
Proceedings of PMAPS 2014 (Durham, 7-10 July 2014)
Author:
Jarman P.
,
Milanovic Jovica V.
,
Patel B.
,
Wang Zhongdong
Publisher:
IEEE (Institute of Electrical and Electronics Engineers)
ISBN:
978-1-4799-3562-8
Conference Location:
Durham University (UK)
Year:
2014
N° catalog:
CFP14826-POD
Hits:
452
Alexandria Book Library